This is for a 2025 summer internship with the following start dates: May - August or June - September for quarter system schools.

The graduate student candidate will use both focused ion beam (FIB) tools to prepare sample of thin films and TEM microscopes to determine microstructure of these thin films including grain orientation and sizes (and their evolution) as well as elemental mapping of grains vs. grain boundaries.  The candidate is expected to work closely with engineers and the research teams.  The work is centered around IBM’s most advanced R&D efforts at its premier research and development site.  Good communication skills and the ability to handle fast-paced, complex work is essential.